ISO7637-2-2011.pdfROAD VEHICLES -- ELECTRICAL DIST

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详细说明：ROAD VEHICLES -- ELECTRICAL DISTURBANCES FROM CONDUCTION AND COUPLING -- PART 2: ELECTRICAL TRANSIENT CONDUCTION ALONG SUPPLY LINES ONLYlso7637-2:2011(E) Contents P age Foreword IV Scope normative references Terms and definitions∴,…,……… Test procedure 4.1 General 4.2 Test temperature and supply voltages 4.3 Voltage transient emissions test……,… 2 44 Transient immunity test.….,… 5 Test instrument description and specifications 5.1 Artificial network∴ 9 5.2 Shunt resistor r 5.3 Switch s 10 5.4 Power supply… 5.5 Measurement instrumentation 12 5.6 Test pulse generator for immunity testing 2 Annex A(informative) Example of test pulse severity levels associated with function performance status classification 17 Annex B (normative) Transient emissions evaluation -Voltage waveform ■国■■ 口 :: 19 Annex c (normative )Test pulse generator verification procedure 23 AnnexD(informative)Determination of pulse generator energy capability... 26 Annex E(informative) Origin of transients in the electric system of road vehicles 30 Annex F(informative) Alternative transient testing technique using electromechanically switched inductive loads ∴33 Bibliography…… 43 ISo 2011-All rights reserved so7637-2:2011(E Foreword ISo(the International Organization for Standardization) is a worldwide federation of national standards bodies (Iso member bodies). The work of preparing International Standards is normally carried out through Iso technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee International organizations, governmental and non-governmental, in liaison with IsO, also take Part in the work. ISO collaborates closely with the International Electrotechnical Commission(IEC)on all matters of electrotechnical standardization International Standards are drafted in accordance with the rules given in the ISo/EC Directives, Part 2 The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75% of the member bodies casting a vote Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. Iso shall not be held responsible for identifying any or all such patent rights ISo 7637-2 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee sc 3, Electrical and electronic equipment This third edition cancels and replaces the second edition (ISo 7637-2: 2004), which has been technically revised. It also incorporates the Amendment ISo 7637-2: 2004/Amd 1: 2008. It does not specify test pulses 4 5a, and 5b, which are now specified in Iso 16750-2 and Iso 21848 Iso 7637 consists of the following parts, under the general title Road vehicles Electrical disturbances from conduction and coupling Part 1: Definitions and general considerations Part 2: Electrical transient conduction along supply lines only Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines o So 2011-All rights reserved INTERNATIONAL STANDARD lso7637-2:2011(E) Road vehicles-- Electrical disturbances from conduction and coupling一 Part 2: Electrical transient conduction along supply lines only 1 Scope This part of Iso 7637 specifies test methods and procedures to ensure the compatibility to conducted electrical transients of equipment installed on passenger cars and commercial vehicles fitted with 12V or 24V electrical systems. It describes bench tests for both the injection and measurement of transients. It is applicable to all types of road vehicles independent of the propulsion system(e.g. spark ignition or diesel engine, electric motor Function performance status classification for immunity to transients is given in Annex A 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments ) applies so 7637-1, Road vehicles- Electrical disturbances from conduction and coupling- Part 1: Definitions and general considerations 3 Terms and definitions For the purposes of this document, the terms and definitions given in Iso 7637-1 apply 4 Test procedure 4.1 Genera Methods for measuring the transient emission on supply lines and test methods for the immunity of devices against such transients are given. These tests, called "bench tests", are performed in the laboratory The bench test methods, some of which require the use of the artificial network will provide comparable results between laboratories a bench test method for the evaluation of the immunity of a device against supply line transients may be performed by means of a test pulse generator. This may not cover all types of transients which can occur in a vehicle; therefore, the test pulses described in 5.6 are characteristic of typical pulses In special cases, it may be necessary to apply additional test pulses. However, some test pulses may be omitted if a device, depending on its function or its connection, is not influenced by comparable transients in the vehicle. It is part of the vehicle manufacturer's responsibility to define the test pulses required for a specific device ISo 2011-All rights reserved lso7637-2:2011(E) 4.2 Test temperature and supply voltages The ambient temperature during the test shall be(23+5)C The supply voltages shall be as shown in Table 1 unless other values are agreed upon by the users of this part of iso 7637, in which case such values shall be documented in the test reports UA is the supply voltage defined in Table 1, which shall be measured at the output of the pulse generator Table 1-Supply voltages Nominal 12 V system Nominal 24 V system Supply voltage CA 13,5±0.5 27±1 4.3 Voltage transient emissions test 4.3.1 General This clause defines a test procedure to evaluate automotive electrical and electronic components for conducted emissions of transients along battery fed or switched supply lines of a device under test (DUT). A DUT which is considered a potential source of conducted disturbances should be tested according to the procedure described in this clause Care shall be taken to ensure that the surrounding electromagnetic environment does not interfere with the measurement set-up The test method applies to DUT with or without internal mechanical or electronic switch driving inductive loads Voltage transients from the disturbance source, the DUT, are measured using the artificial network to standardize the impedance loading on the dUT (see 5.1) All wiring connections between the artificial network, switch, and the DUT shall be spaced (50 t 5)mm above the metal ground plane The cable sizes shall be chosen in accordance with the real situation in the vehicle, i.e. the wiring shall be capable of handling the operating current of the DUT, and as agreed between vehicle manufacturer and supplier. Grounding of the duT case to the ground plane shall reflect the vehicle installation and shall be defined in a test plan If no requirements are specified in the test plan, then the dut shall be placed on a non-conductive material (50+ 5)mm above the ground plane The supply voltage UA and the disturbance voltage shall be measured (see 4.3.2 and 4.3.3 for measurement guidance)using a voltage probe(see 5.5)and an oscilloscope or waveform acquisition equipment For values. see annex B DUT operating conditions of particular interest in the measurements are the switch-off and the exercising of the various operating modes of the dUT. Exact operating conditions of the dUt shall be specified in the test plan NOTE Measurements at turn-on can be of interest in some instances o So 2011-All rights reserved lso7637-2:2011(E) The sampling rate and trigger level shall be selected to capture a waveform displaying the complete duration of the transient, and with sufficient resolution to display the highest positive and negative portions of the transient Utilising the proper sampling rate and trigger level, the voltage amplitude shall be recorded by actuating the DUT according to the test plan. Other transient parameters, such as rise time, fall time, transient duration, etc may also be recorded. Unless otherwise specified, ten waveform acquisitions are necessary. It is necessary to report only the waveforms with the highest positive and negative amplitude(with their associated parameters) The measured transient shall be evaluated in accordance with Annex B. All pertinent information and test results shall be reported. If required per test plan, include transient evaluation results with respect to the performance objective as specified in the test plan The test applies to an inductive load(such as power window, power seat, relay, electric mirror, etc. )with a large inductance or a high load current, which connects to the vehicle power supply, or a DUT which switches such an inductive load If an inductive load has a small inductance or a low load current and is driven by an internal regulated voltage e.g. 5V), which is isolated from the vehicle power supply, the test is not applicable unless specified in a test lan 4.3.2 Test set-up for slow pulses The test set-up is described in Figure 1 a) The disturbance source is connected via the artificial network to the shunt resistor Rs (see 5.2 ), the switch S (see 5.3)and the power supply(see 5. 4) The switch S represents the main switch(e. g. ignition switch, relay, etc. )which supplies the DUT and could be located at several metres from the dut In the case of a dUt having an internal mechanic and/or electronic switch driving inductive load, the test set- up described in Figure 1 a)is applicable with the dut internal switch closed (DUT inductive loads powered when opening switch s) Depending on the DUT internal switch type(relay, electronic switches, IGBT, etc. ) it may not be possible to ensure a controlled closure of the internal switch. The detail state of the internal switch(es shall be recorded in the test report Transients generated by the supply disconnection of the dUT are measured at the moment of opening the switch S(the switch S is operated in order to generate transient disturbance) ISo 2011-All rights reserved so7637-2:2011(E Dimensions in millimetres Drawing not to scale 6( A 500 200±50 a)Transient emission test set-up to measure slow pulses(ms-range or slower) Figure 1--Transient emission test set-up to measure pulses(continued) 4.3.3 Test set-up for fast pulses The test set-up is described in Figure 1 b) for DUT without internal switch The disturbance source is connected via the artificial network to the shunt resistor Rs (see 5.2), the switch S ee 5. 3) and the power supply(see 5.4 Transients generated by the supply disconnection of the dUt are measured at the moment of opening the switch S (the switch S is operated in order to generate transient disturbance) o So 2011-All rights reserved lso7637-2:2011(E) Dimensions in millimetres Drawing not to scale B 200±50 200±50 b) Transient emission test set-up to measure fast pulses(ns to us range for dut without internal switch Figure 1- Transient emission test set-up to measure pulses(continued) The test set-up is described in Figure 1 c)for dUt with internal switch The disturbance source is connected via the artificial network to the shunt resistor Rs(see 5.2)and the power supply (see 5.4) In this case the internal switch shall be operated in order to generate transient disturbance(there is no need for the switch S) Transients generated by the supply disconnection of the dUT are measured at the moment of opening the internal switch (the switch is operated in order to generate transient disturbance ) with the probe connected as close to the dUT terminals as possible ISo 2011-All rights reserved so7637-2:2011(E Dimensions in millimetres Drawing not to scale 6 尺 200±50 200±50 c)Transient emission test set-up to measure fast pulses(ns to us rang for dut with internal switch Key 1 oscilloscope or equivalent voltage probe 3 artificial network 4 DUT(source of transient 5 ground plane 6 power supply 7 ground connection; length <100 mm Rs shunt resistance, as specified in 5.2 s switch, as specified in 5.3 Ua supply voltage NOTE For A, B, and P, see Figure 3 a Optionally with internal switch driving inductive load b With internal load and switch Figure 1- Transient emission test set-up to measure pulses 4. 4 Transient immunity test 4, 4.1 Location of the dut The dUt shall be placed on a non-conductive low relative permittivity(er 1, 4)support with a thickness of (50±5)mm Grounding of the dUt case to the ground plane shall reflect the vehicle installation and shall be defined in a test plan o So 2011-All rights reserved

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