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  1. 面向串扰时延效应的时序分析方法及在集成电路测试中的应用

  2. As the feature size continues to shrink into the nanometer era, the crosstalk-induced effect on circuit timing becomes significant. It is essential that potential crosstalk-induced delay effects should be estimated, identified, tested accurately and
  3. 所属分类:其它

    • 发布日期:2021-02-22
    • 文件大小:596992
    • 提供者:weixin_38519660