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  1. Analysis of the magnitude and distribution of low loss thin film

  2. Total loss test of the high-reflective (HR) film coated on super-smooth silica substrate by dual ion beam sputtering (DIBS) is based on the well-established cavity ring-down technique. Scattering and transmittance are tested by integral scattering an
  3. 所属分类:其它

    • 发布日期:2021-02-10
    • 文件大小:343040
    • 提供者:weixin_38675967