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  1. Effects of defect, carrier concentration and annealing process on the photoluminescence of silicon pn diodes

  2. Silicon pit diodes were fabricated by ion implantation of B and P ions with different doses and subsequent annealing processes. Room temperature photoluminescence (PL) were investigated and the factors affecting the PL intensity were analyzed. Result
  3. 所属分类:其它

    • 发布日期:2021-02-20
    • 文件大小:237568
    • 提供者:weixin_38625143