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  1. Spectroscopic Ellipsometry Principles and Applications

  2. 介绍椭圆偏振光术测量的原理及其应用。主要涉及光在材料及薄膜表面反射后偏振状态变化及其测量的技术。

  3. 所属分类：专业指导

    • 发布日期：2010-10-31
    • 文件大小：13631488
    • 提供者：nczhugoal

  1. Handbook of ellipsometry

  2. It's a handbook about ellepsometry, and will be helpful if you want do some research in the area of polarization.

  3. 所属分类：其它

    • 发布日期：2010-11-18
    • 文件大小：6291456
    • 提供者：kellaya

  1. usefui Mueller matrix symmetries for ellipsometry

  2. usefui Mueller matrix symmetries for ellipsometry t

  3. 所属分类：讲义

    • 发布日期：2019-01-15
    • 文件大小：953344
    • 提供者：weixin_44437165

  1. Spectroscopic ellipsometric properties and resistance switching behavior in Six(ZrO2)100x films

  2. We prepare Six(ZrO2)100?x composite films using the co-sputtering method. The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy. Thermal treatment influences on optical p

  3. 所属分类：其它

    • 发布日期：2021-02-25
    • 文件大小：595968
    • 提供者：weixin_38637580

  1. Application of spectroscopic ellipsometry for the study of electrical and optical properties of indium tin oxide thin fi

  2. Application of spectroscopic ellipsometry for the study of electrical and optical properties of indium tin oxide thin films

  3. 所属分类：其它

    • 发布日期：2021-02-10
    • 文件大小：567296
    • 提供者：weixin_38721652

  1. Spectroscopic imaging ellipsometry for characterization of nanofilm pattern on Si substrate

  2. Spectroscopic imaging ellipsometry (SIE) is used to characterize a nanofilm pattern on a solid substrate. The combination of a xenon lamp, a monochromator, and collimating optics is utilized to provide a probe beam with diameter of 25 mm, a charge-co

  3. 所属分类：其它

    • 发布日期：2021-02-10
    • 文件大小：964608
    • 提供者：weixin_38742954

  1. Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-

  2. The optical constants, photoluminescence properties, and resistivity of Al-Alq3 thin films prepared by the thermal co-evaporation method on a silicon substrate are studied with various Al fractions. A variable angle spectroscopic ellipsometry is empl

  3. 所属分类：其它

    • 发布日期：2021-02-04
    • 文件大小：386048
    • 提供者：weixin_38682161

  1. Optimizing power oscillations in an ellipsometric system

  2. Ellipsometry is a powerful and well-established optical technique used in the characterization of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We propose an ell

  3. 所属分类：其它

    • 发布日期：2021-02-04
    • 文件大小：434176
    • 提供者：weixin_38705640

  1. Robust and accurate terahertz time-domain spectroscopic ellipsometry

  2. In this work, we show how fiber-based terahertz systems can be robustly configured for accurate terahertz ellipsometry. To this end, we explain how our algorithms can be successfully applied to achieve accurate spectroscopic ellipsometry with a high

  3. 所属分类：其它

    • 发布日期：2021-01-27
    • 文件大小：1048576
    • 提供者：weixin_38534352