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  1. Fabrication of nc-Si/SiO2 structure by thermal oxidation method and its luminescence characteristics

  2. Nano-crystalline silicon/silicon oxide (nc-Si/SiO2 structures have been prepared from amorphous silicon films on both silicon and quartz substrates by using electron-beam evaporation approach and annealing at temperatures about 600 oC in air. As a th
  3. 所属分类:其它

    • 发布日期:2021-02-10
    • 文件大小:546816
    • 提供者:weixin_38727928