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  1. Improved phase-shifting diffraction interferometer for microsphere topography measurements

  2. In this study, an improved phase-shifting diffraction interferometer for measuring the surface topography of a microsphere is developed. A common diode-pumped solid state laser is used as the light source to facilitate apparatus realization, and a ne
  3. 所属分类:其它

    • 发布日期:2021-02-07
    • 文件大小:643072
    • 提供者:weixin_38621630