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  1. Interface roughness, surface roughness and soft X-ray reflectivity of Mo/Si multilayers with different layer number

  2. A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers we
  3. 所属分类:其它

    • 发布日期:2021-02-10
    • 文件大小:252928
    • 提供者:weixin_38672731