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  1. Laser direct writing pattern structures on AgInSbTe phase change thin film

  2. Different pattern structures are obtained on the AgInSbTe (AIST) phase change film as induced by laser beam. Atomic force microscopy (AFM) was used to observe and analyze the different pattern structures. The AFM photos clearly show the gradually cha
  3. 所属分类:其它

    • 发布日期:2021-02-25
    • 文件大小:1048576
    • 提供者:weixin_38548434