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  1. Laser induced damage of multi-layer dielectric used in pulse compressor gratings

  2. Laser induced damage threshold (LIDT) of multi-layer dielectric used in pulse compressor gratings (PCG) was investigated. The sample was prepared by e-beam evaporation (EBE). LIDT was detected following ISO standard 11254-1.2. It was found that LIDTs
  3. 所属分类:其它

    • 发布日期:2021-02-11
    • 文件大小:285696
    • 提供者:weixin_38605590