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  1. Low power consumption bipolar resistive switching characteristics of ZnO-based memory devices

  2. Ag/ZnO/Pt structure resistive switching devices are fabricated by radio frequency (RF) magnetron sputtering at room temperature. The memory devices exhibit stable and reversible resistive switching behavior. The ratio of high resistance state to low
  3. 所属分类:其它

    • 发布日期:2021-02-25
    • 文件大小:326656
    • 提供者:weixin_38727928