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上传时间: 2014-11-13
详细说明： A data error occurring when the SSD is read after an extended period of time following the previous write. NOTE A number of distinct failure mechanisms are respons ible for retention failures, and in general these are accelerated in different ways by temperature and other adjustable qualifica tion parameters. For example, in floating-gate memories, failure may occur due to defects that allow charge to leak through the transfer dielectric or by the detrapping of charge in the transfer dielectric; the former can be weakly accelerated or ev en decelerated by high temperature, and the latter can be highly temperature accelerated (see JE P122). For these reasons, retention may depend on temperature but it is not known a priori whether high temperature is worse than low temperature, or vice-versa. ...展开收缩
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