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松下薄膜电容器ECHU(C)产品说明.pdf
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详细说明:松下薄膜电容器ECHU(C)产品说明pdf,该产品特点是小巧、轻盈;损耗小,卓越频率性能;回流焊专用;已应对RoHS指令。主要用途:用于时间常数电路;用于滤波电路;用于振荡电路;用于液晶背景光变频电源共振电路。andard Doc
28-75
Product
PLASTIC FILM CHIP CAPACITOR
1-22
Specifications
TYPE ECHU1(C)
F
Reference
3/16
No
Item
Performance
Testing method
The capacitor under test shall be put in the testing oven and
kept at condition of the temperature at 40C+2C and the
humidity at 90%Rh to 95 %RH for 1000hours +48/-0 hours
and then shall be let alone at ordinary condition for 1.5hours
±0.5 hours
After the test, the capacitor shall be satisfied with the
following performance
Appearance
No remarkable change
JSC5102-1994
Moisture
Dielectric Withstand Voltage
Between terminals
9.5
resistance(D)
Nothing abnormal shall be found, when applied a
EC384-1-1982
voltage of 130% of the rated voltage for 1 minute
4.22
(The capacitor shall be applied the voltage through
2kQ or more when charge or discharge
Insulation resistance
Between terminals
1000MQ or more
Change rate of capacitance
Within +2 of the value before the tesl
Dissipation factor
0. 9% or less(at 1kHz)
The capacitor under test shall be applied the rated voltage
continuously for 1000hours +48/0 hours in the testing oven
and kept at condition of the temperature at +40C+2C and
the humidity at 90%RH to 95%RH and then shall be let alone
at ordinary condition for 1. 5hours +0.5 hours
After the test, the capacitor shall be satisfied with the
following performance
A
ppearance
No remarkable change
Moisture
Dielectric Withstand voltage
9
resistant
Between terminals
J|SC5102-1994
9.9
loading(l)
Nothing abnormal shall be found, when applied a
voltage of 130% of the rated voltage for 1 minutes
(The capacitor shall be applied the voltage through
2kQ or more when charge or discharge.
Insulation resistance
Between terminals
1000MQ or more
Change rate of capacitance
Within +2%o of the value before the test
Dissipation factor
0.9%o or less(at 1kHz
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
Standard Doc
28-75
Product
PLASTIC FILM CHIP CAPACITOR
1-22
Specifications
TYPE ECHU1(C)
F
Reference
4/16P
No
Item
Performance
I Testing method
The capacitor under test shall be applied the voltage of 125%
of rated voltage through a series-connected resister of from
2022 to 1000Q2 per 1v, continuously for 1000hours +48/-o
hours in the testing oven and kept at condition of the
temperature at +105C +2C and then shall be let alone at
ordinary condition for 1. 5hours to.5 hours
After the test, the capacitor shall be satisfied with the
High
following performance.
10
temperature
J|SC5102-1994
loading
Appearance
9.10
No remarkable change
Insulation resistance
Between terminals
1000MQ or more
Change rate of capacitance
Within +2% of the value before the test
Dissipation factor
0.66% or less(at 1kHz)
Insulation resistance at+105℃C±2° C after2hous+1/-0
hours
Insulation resistance
JSc5102-1994
Heat
Between terminals
Resistance
EC384-1-1982
1000MQ or more
Change rate of capacitance at+105°C±2° C after2 hours
4.21.2
+1/-0 hours
Within +3/-2% of the value before the test
Change rate of capacitance at -55C +2 C after 2hours
J|SC5102-1994
9.1
12.
Cold
+1/-0 hours
Resistance
Within +2o of the value before the test
EC384-1-1982
4.21.4
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
tandard doc
28-75
Product
PLASTIC FILM CHIP CAPACITOR
1-22
Specifications
TYPE ECHU1(C)
Reference
5/16
No
Item
Performance
Testing method
1. Reflow method
Test condition of the reflow oven shall be adjusted that
maximum temperature of the capacitor surface shall be
260°C±3°C.( see Fig.1.)
After the test, the capacitor shall be let alone at ordinary
temperature and humidity for 1hour +0.5 hours. After this
the capacitor shall be satisfied with the following
performance
2. Soldering iron method
The soldering iron of a 30-watt shall be used and the
temperature of the soldering iron shall be adjusted at
260°C±10°C
The soldering iron together with a solder wire of 1 mm
diameter shall be put to each outer electrode of the
capacitor for 3.5s to,5s
Soldering
After this, the capacitor shall be satisfied with the following
13.
Heat
erFormance
Resistance
Appearance
No remarkable change
Dielectric Withstand Voltage
Between terminals
Nothing abnormal shall be found, when applied a
voltage of 150% of the rated voltage for 1 minute
(The capacitor shall be applied the voltage through
2kQ2 or more when charge or discharge
Insulation resistance
Between terminals
1000M0 or more
Change rate of capacitance
Within +% of the value before the tesi
Dissipation factor
0. 66%or less(at 1kHz)
Connection
Stable
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
Standard doc
Clsf
28-75
Product
PLASTIC FILM CHIP CAPACITOR
TYPE ECHUIC
上
pecifications
Reference
6/16P
No
Item
Performance
I Testing method
The capacitor under the test shall be put in the testing oven
and kept at condition of the temperature of-55°C±3°Cfor
30mint 3min. After this, the capacitor shall be let alone at the
ordinary temperature for 3 min or less
After this, the capacitor under the test shall be put in the
testing oven and kept at condition of the temperature of
+125°C±2°Cfor30min±3min
Then the capacitor shall be let alone at the ordinary
temperature for 3 min or less
This operation shall be counted as 1 cycle, and it shall be
repeated for 5 cycles successively
14/emperature
After the test, the capacitor shall be let alone at the ordinary JIS C 5102-1994
cycle
condition for 1. 5hours +o5hours, and shall be satisfied with
9.3
the following performance
Appearance
No remarkable change
Insulation resistance
Between terminais
1000MQ or more
Change rate of capacitance
Nithin +2% of the value before the test
Dissipation factor
0.66 or less(at 1kHz)
Permissible current to pulse current
The pulse permissible current is generally obtained by the
product of dVidt(V/us)value and capacitance(uF)
=C·dV/dt
However, number of repetitions is 10, 000 cycles or less
Make sure the rms current is within the permissible value
(See Tab. 1)
15. dV/dt
Insulation resistance
Between terminals
500MQ or more
Change rate of capacitance
Within +% of the value before the test
Dissipation factor
0.8% or less (at 1 kHz
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
I Standard Doc
clsf
28-75
Product
PLASTIC FILM CHIP CAPACITOR
2
TYPE ECHUIC
n
pecifications
Reference
7/16P
No
Item
Performance
Testing method
The capacitor under test shall be applied a current and rated
voltage of 110% of allowable current specified in Fig. 2
showed as below, for 1000hours+48/-Ohours in the testing
oven and kept at condition of the temperature at105°c±3°C
and then shall be let alone at ordinary condition for 1.5hours
士0.5 hours
After the test, the capacitor shall be satisfied with the
High
following performance
16
temperature
high frequency
Appearance
oading
No remarkable change
Insulation resistance
Between terminals
1000MQ or more
Change rate of capacitance
Within t2% of the value before the test
Dissipation factor
0. 66%or less(at 1kHz)
The capacitor under test shall be applied a current and rated
voltage of allowable current specified in Fig. 2 showed as
below, for 1000hours +48/-Ohours in the testing oven and
kept at condition of the temperature at 40 C t2 c and the
humidity at g0% to 95% and then shall be let alone at
ordinary condition for 1.5hours to 5hours
After the test, the capacitor shall be satisfied with the
following performance
Appearance
Moisture
No remarkable change
17
Resistant high
Withstand voltage
Frequency
Between terminais
loading
Nothing abnormal shall be found, when applied a
voltage of 130% of the rated voltage for 1 minutes
(The capacitor shall be applied the voltage through
2kQ or more when charge or discharge.
Insulation resistance
Between terminals
1000MQ or more
Change rate of capacitance
Within +% of the value before the test
Dissipation factor
0. 9% or less(at 1kHz)
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
Standard Doc.
Clsf
28-75
Product
PLASTIC FILM CHIP CAPACITOR
1-22
eviston
Specifications
TYPE ECHU1(C
F
Reference
8/16王
No
Item
Performance
Testing method
The equipment shall permit pressurizing
Apply a force to the center of specimen, using a pressurizing
as shown in the drawing. The pressure shall be 5N +O5N
and the holding duration, 10s t1 s
18. Robustness of
J|Sc5102-1994
capacitor body
8.12
Appearance
No remarkable change
Mount the specimen to the testing wiring printed board
EXamine, with a magnifier of magnification of 10, the
appearance of specimen
As shown in below, apply the pressurizing jig to the center in
the longitudinal direction of specimen
Apply a force to the pressurizing jig gradually in the
horizontal direction with the testing printed wiring board
The pressure shall be 5N +O5N, and the holding duration
10s±1s
19. Adhesivenes
After the test, use magnifier of magnification of 10, and check JIS C5102-1994
for cracks of soldering position
Appearance
No remarkable change
The bending stroke shall be 1mm Pressurizing shall be
20
Resistance of
carriedout at the rate of 1mm/s. After reaching the specified JIS C5102-1994
Board to bending bending, keep it for 5s+1s
8.11.1
After the test no breaking of the terminal shall be found.
Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division
Standard doc
Clsf
28-75
Product
PLASTTC FILM CHIP CAPACITOR
1-22
Specifications
TYPE CHUI(C)
visIon
F
Reference9/16卫
Fig 1 Standard surface temperature curve of the capacitor for reflow method
Please confirm the test of the reflow method within the range of the under mentioned profile
(The guarantee temperature and time are numerical values of the bold faced type in the profile)
TEST CONDITION
50X115. 0.8 mm thickness
lass epoxy board
Thermocouple K
s Thermo electromotive for
wire diameter 0.1 mmg
dummy
CAttach thermocouple on the parts top surface
emperature( c)of the capacitor surface
max260°C
250
250%C or more. 30s max
220° Cor more.95smax
200
oa8
100
50
40s
90
60s~150s
20s~80s
max 70s
Time
Panasonic Electronic Devices Japan Co Ltd. Film Capacitor Division
Standard doc
claf
2875
Product
PLASTIC FILM CHIP CAPACITOR
1-22
Specifications
TYPE ECHU1(C)
Reference
10/16P
10. //Caution about safety in use
I Operating range(voltage, current, operating temperature)
Use the capacitor within the specified limits listed below(a to d). Over rated conditions might cause deterioration
damage, smoke and fire. Do not use capacitor beyond range of the condition
a permissible voltage
DC rated voltage of this product is 100V. Use the capacitor within DC rated voltage
When used in AC applied circuit, less than 40Vms should be applied
When used in a high frequency, less than 40Vms should be applied and current applied should be less than the
value of permissible current in Fig. 2 in page 16. Please consult in advance when capacitors are used between
60Hz to 10kHz at frequency.
Not to be in connected directly to Primary or AC line. Guarantee contents refer to No 16 and No 17 of
CHARACTER
Use the peak of pulse voltage applied the capacitor within the dc rated voltage
Caution about safety in inverter circuit for LCD back light use
Use the +B voltage applied within 130V, as shown below [Typical electronic inverter circuit for LCD back light]
And please use the peak of pulse voltage(especially, in case of the using PWM brightness circuit) applied the
capacitor within the dC rated voltage
Typical electronic inverter circuit for LCD back light]
L
p
b)Permissible current
The permissible current must be considered by dividing into pulse current (peak current and continuous
current(ms current). When using, therefore, make sure the both current are within the permissible values
In the case that a continuous current value is able not to be measured, use the capacitor within 10oC as the
inherent temperature rise confirmed by the measuring method shown in page 15
Continuous current should be within specified figure in Fig. 2. Contact us when the waveforms are totally
different from the sine wave
Pulse current should be within the figures calculated by Tab. 1. Use within 10000 cycles of pulse current
When pulse current applied more than 10000 cycles, please consult us before use
c)Operating temperature range
It must be noted, however the operating temperature range is the surface temperature of the capacitor, not
the ambient temperature of the capacitor.
In actual use, make sure the sum of the ambient temperature own temperature rise value(Within specified
value), that is the capacitor surface temperature is within the rated operating temperature range
If there is cooling plate of the other part of any resistance heated to high temperature near the capacitor, the
capacitor may be locally heated by the radiation heat, exceeding the operating temperature range, and
smoking or firing may be caused. Check the capacitor surface temperature at the heat source side
d)others
Protective means for safety should be provided in case the pulse and ms current may exceed the permissible
values due to abnomal action of elsewhere in the circuit
Please consult in advance when capacitors are connected in parallel to supplement capacitance
Panasonic Electronic Devices Japan Co. Ltd. Film Capacitor Division
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