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文件名称: 松下薄膜电容器ECHU(C)产品说明.pdf
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 详细说明:松下薄膜电容器ECHU(C)产品说明pdf,该产品特点是小巧、轻盈;损耗小,卓越频率性能;回流焊专用;已应对RoHS指令。主要用途:用于时间常数电路;用于滤波电路;用于振荡电路;用于液晶背景光变频电源共振电路。andard Doc 28-75 Product PLASTIC FILM CHIP CAPACITOR 1-22 Specifications TYPE ECHU1(C) F Reference 3/16 No Item Performance Testing method The capacitor under test shall be put in the testing oven and kept at condition of the temperature at 40C+2C and the humidity at 90%Rh to 95 %RH for 1000hours +48/-0 hours and then shall be let alone at ordinary condition for 1.5hours ±0.5 hours After the test, the capacitor shall be satisfied with the following performance Appearance No remarkable change JSC5102-1994 Moisture Dielectric Withstand Voltage Between terminals 9.5 resistance(D) Nothing abnormal shall be found, when applied a EC384-1-1982 voltage of 130% of the rated voltage for 1 minute 4.22 (The capacitor shall be applied the voltage through 2kQ or more when charge or discharge Insulation resistance Between terminals 1000MQ or more Change rate of capacitance Within +2 of the value before the tesl Dissipation factor 0. 9% or less(at 1kHz) The capacitor under test shall be applied the rated voltage continuously for 1000hours +48/0 hours in the testing oven and kept at condition of the temperature at +40C+2C and the humidity at 90%RH to 95%RH and then shall be let alone at ordinary condition for 1. 5hours +0.5 hours After the test, the capacitor shall be satisfied with the following performance A ppearance No remarkable change Moisture Dielectric Withstand voltage 9 resistant Between terminals J|SC5102-1994 9.9 loading(l) Nothing abnormal shall be found, when applied a voltage of 130% of the rated voltage for 1 minutes (The capacitor shall be applied the voltage through 2kQ or more when charge or discharge. Insulation resistance Between terminals 1000MQ or more Change rate of capacitance Within +2%o of the value before the test Dissipation factor 0.9%o or less(at 1kHz Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division Standard Doc 28-75 Product PLASTIC FILM CHIP CAPACITOR 1-22 Specifications TYPE ECHU1(C) F Reference 4/16P No Item Performance I Testing method The capacitor under test shall be applied the voltage of 125% of rated voltage through a series-connected resister of from 2022 to 1000Q2 per 1v, continuously for 1000hours +48/-o hours in the testing oven and kept at condition of the temperature at +105C +2C and then shall be let alone at ordinary condition for 1. 5hours to.5 hours After the test, the capacitor shall be satisfied with the High following performance. 10 temperature J|SC5102-1994 loading Appearance 9.10 No remarkable change Insulation resistance Between terminals 1000MQ or more Change rate of capacitance Within +2% of the value before the test Dissipation factor 0.66% or less(at 1kHz) Insulation resistance at+105℃C±2° C after2hous+1/-0 hours Insulation resistance JSc5102-1994 Heat Between terminals Resistance EC384-1-1982 1000MQ or more Change rate of capacitance at+105°C±2° C after2 hours 4.21.2 +1/-0 hours Within +3/-2% of the value before the test Change rate of capacitance at -55C +2 C after 2hours J|SC5102-1994 9.1 12. Cold +1/-0 hours Resistance Within +2o of the value before the test EC384-1-1982 4.21.4 Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division tandard doc 28-75 Product PLASTIC FILM CHIP CAPACITOR 1-22 Specifications TYPE ECHU1(C) Reference 5/16 No Item Performance Testing method 1. Reflow method Test condition of the reflow oven shall be adjusted that maximum temperature of the capacitor surface shall be 260°C±3°C.( see Fig.1.) After the test, the capacitor shall be let alone at ordinary temperature and humidity for 1hour +0.5 hours. After this the capacitor shall be satisfied with the following performance 2. Soldering iron method The soldering iron of a 30-watt shall be used and the temperature of the soldering iron shall be adjusted at 260°C±10°C The soldering iron together with a solder wire of 1 mm diameter shall be put to each outer electrode of the capacitor for 3.5s to,5s Soldering After this, the capacitor shall be satisfied with the following 13. Heat erFormance Resistance Appearance No remarkable change Dielectric Withstand Voltage Between terminals Nothing abnormal shall be found, when applied a voltage of 150% of the rated voltage for 1 minute (The capacitor shall be applied the voltage through 2kQ2 or more when charge or discharge Insulation resistance Between terminals 1000M0 or more Change rate of capacitance Within +% of the value before the tesi Dissipation factor 0. 66%or less(at 1kHz) Connection Stable Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division Standard doc Clsf 28-75 Product PLASTIC FILM CHIP CAPACITOR TYPE ECHUIC 上 pecifications Reference 6/16P No Item Performance I Testing method The capacitor under the test shall be put in the testing oven and kept at condition of the temperature of-55°C±3°Cfor 30mint 3min. After this, the capacitor shall be let alone at the ordinary temperature for 3 min or less After this, the capacitor under the test shall be put in the testing oven and kept at condition of the temperature of +125°C±2°Cfor30min±3min Then the capacitor shall be let alone at the ordinary temperature for 3 min or less This operation shall be counted as 1 cycle, and it shall be repeated for 5 cycles successively 14/emperature After the test, the capacitor shall be let alone at the ordinary JIS C 5102-1994 cycle condition for 1. 5hours +o5hours, and shall be satisfied with 9.3 the following performance Appearance No remarkable change Insulation resistance Between terminais 1000MQ or more Change rate of capacitance Nithin +2% of the value before the test Dissipation factor 0.66 or less(at 1kHz) Permissible current to pulse current The pulse permissible current is generally obtained by the product of dVidt(V/us)value and capacitance(uF) =C·dV/dt However, number of repetitions is 10, 000 cycles or less Make sure the rms current is within the permissible value (See Tab. 1) 15. dV/dt Insulation resistance Between terminals 500MQ or more Change rate of capacitance Within +% of the value before the test Dissipation factor 0.8% or less (at 1 kHz Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division I Standard Doc clsf 28-75 Product PLASTIC FILM CHIP CAPACITOR 2 TYPE ECHUIC n pecifications Reference 7/16P No Item Performance Testing method The capacitor under test shall be applied a current and rated voltage of 110% of allowable current specified in Fig. 2 showed as below, for 1000hours+48/-Ohours in the testing oven and kept at condition of the temperature at105°c±3°C and then shall be let alone at ordinary condition for 1.5hours 士0.5 hours After the test, the capacitor shall be satisfied with the High following performance 16 temperature high frequency Appearance oading No remarkable change Insulation resistance Between terminals 1000MQ or more Change rate of capacitance Within t2% of the value before the test Dissipation factor 0. 66%or less(at 1kHz) The capacitor under test shall be applied a current and rated voltage of allowable current specified in Fig. 2 showed as below, for 1000hours +48/-Ohours in the testing oven and kept at condition of the temperature at 40 C t2 c and the humidity at g0% to 95% and then shall be let alone at ordinary condition for 1.5hours to 5hours After the test, the capacitor shall be satisfied with the following performance Appearance Moisture No remarkable change 17 Resistant high Withstand voltage Frequency Between terminais loading Nothing abnormal shall be found, when applied a voltage of 130% of the rated voltage for 1 minutes (The capacitor shall be applied the voltage through 2kQ or more when charge or discharge. Insulation resistance Between terminals 1000MQ or more Change rate of capacitance Within +% of the value before the test Dissipation factor 0. 9% or less(at 1kHz) Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division Standard Doc. Clsf 28-75 Product PLASTIC FILM CHIP CAPACITOR 1-22 eviston Specifications TYPE ECHU1(C F Reference 8/16王 No Item Performance Testing method The equipment shall permit pressurizing Apply a force to the center of specimen, using a pressurizing as shown in the drawing. The pressure shall be 5N +O5N and the holding duration, 10s t1 s 18. Robustness of J|Sc5102-1994 capacitor body 8.12 Appearance No remarkable change Mount the specimen to the testing wiring printed board EXamine, with a magnifier of magnification of 10, the appearance of specimen As shown in below, apply the pressurizing jig to the center in the longitudinal direction of specimen Apply a force to the pressurizing jig gradually in the horizontal direction with the testing printed wiring board The pressure shall be 5N +O5N, and the holding duration 10s±1s 19. Adhesivenes After the test, use magnifier of magnification of 10, and check JIS C5102-1994 for cracks of soldering position Appearance No remarkable change The bending stroke shall be 1mm Pressurizing shall be 20 Resistance of carriedout at the rate of 1mm/s. After reaching the specified JIS C5102-1994 Board to bending bending, keep it for 5s+1s 8.11.1 After the test no breaking of the terminal shall be found. Panasonic Electronic Devices Japan Co, Ltd. Film Capacitor Division Standard doc Clsf 28-75 Product PLASTTC FILM CHIP CAPACITOR 1-22 Specifications TYPE CHUI(C) visIon F Reference9/16卫 Fig 1 Standard surface temperature curve of the capacitor for reflow method Please confirm the test of the reflow method within the range of the under mentioned profile (The guarantee temperature and time are numerical values of the bold faced type in the profile) TEST CONDITION 50X115. 0.8 mm thickness lass epoxy board Thermocouple K s Thermo electromotive for wire diameter 0.1 mmg dummy CAttach thermocouple on the parts top surface emperature( c)of the capacitor surface max260°C 250 250%C or more. 30s max 220° Cor more.95smax 200 oa8 100 50 40s 90 60s~150s 20s~80s max 70s Time Panasonic Electronic Devices Japan Co Ltd. Film Capacitor Division Standard doc claf 2875 Product PLASTIC FILM CHIP CAPACITOR 1-22 Specifications TYPE ECHU1(C) Reference 10/16P 10. //Caution about safety in use I Operating range(voltage, current, operating temperature) Use the capacitor within the specified limits listed below(a to d). Over rated conditions might cause deterioration damage, smoke and fire. Do not use capacitor beyond range of the condition a permissible voltage DC rated voltage of this product is 100V. Use the capacitor within DC rated voltage When used in AC applied circuit, less than 40Vms should be applied When used in a high frequency, less than 40Vms should be applied and current applied should be less than the value of permissible current in Fig. 2 in page 16. Please consult in advance when capacitors are used between 60Hz to 10kHz at frequency. Not to be in connected directly to Primary or AC line. Guarantee contents refer to No 16 and No 17 of CHARACTER Use the peak of pulse voltage applied the capacitor within the dc rated voltage Caution about safety in inverter circuit for LCD back light use Use the +B voltage applied within 130V, as shown below [Typical electronic inverter circuit for LCD back light] And please use the peak of pulse voltage(especially, in case of the using PWM brightness circuit) applied the capacitor within the dC rated voltage Typical electronic inverter circuit for LCD back light] L p b)Permissible current The permissible current must be considered by dividing into pulse current (peak current and continuous current(ms current). When using, therefore, make sure the both current are within the permissible values In the case that a continuous current value is able not to be measured, use the capacitor within 10oC as the inherent temperature rise confirmed by the measuring method shown in page 15 Continuous current should be within specified figure in Fig. 2. Contact us when the waveforms are totally different from the sine wave Pulse current should be within the figures calculated by Tab. 1. Use within 10000 cycles of pulse current When pulse current applied more than 10000 cycles, please consult us before use c)Operating temperature range It must be noted, however the operating temperature range is the surface temperature of the capacitor, not the ambient temperature of the capacitor. In actual use, make sure the sum of the ambient temperature own temperature rise value(Within specified value), that is the capacitor surface temperature is within the rated operating temperature range If there is cooling plate of the other part of any resistance heated to high temperature near the capacitor, the capacitor may be locally heated by the radiation heat, exceeding the operating temperature range, and smoking or firing may be caused. Check the capacitor surface temperature at the heat source side d)others Protective means for safety should be provided in case the pulse and ms current may exceed the permissible values due to abnomal action of elsewhere in the circuit Please consult in advance when capacitors are connected in parallel to supplement capacitance Panasonic Electronic Devices Japan Co. Ltd. Film Capacitor Division
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