IEEE C62.41.pdfIEEE C62.41, 浪涌测试标准，主要描述波形。TEEE tha

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详细说明：IEEE C62.41, 浪涌测试标准，主要描述波形。TEEE thanks the International Electrotechnical Commission (EC) for permission to reproduce information from its International Standards, Technical Reports, and Technical Specifications: IEC 61312-1: 1995 Figure A 1 and Figure A 2: IEC 61643-1: 1998--Figure A 3: IEC 61312.3: 2000--Figure A 4. All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is availablefromwww.iec.ch.IeChasnoresponsibilityfortheplacementandcontextinwhichtheextracts and contents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracy therein Abstract: The scope of this recommended practice is to characterize the surge environment at locations on ac power circuits described in IEEE Std C62. 41.1-2002 by means of standardized waveforms and other stress parameters. The surges considered in this recommended practice do not exceed one half-cycle of the normal mains waveform(fundamental frequency) in duration. They can be periodic or random events and can appear in any combination of line, neutral, or grounding conductors. They include surges with amplitudes, durations, or rates of change sufficient to cause equipment damage or operational upset. While surge protective devices( sPDs) acting primarily on the amplitude of the voltage or current are often applied to divert the damaging surges, the upsetting surges might require other remedies Keywords: low-voltage ac power circuit, surge testing, surge withstand level The Institute of Electrical and Electronics Engineers, Inc 3 Park Avenue, New york. Ny 10016-5997, USA Copyright o 2002 by the Institute of Electrical and Electronics Engineers, Inc All rights reserved. Published 11 April 2003. Printed in the United States of America National Electrical Code and nec are both registered trademarks owned by the National Fire Protection Association, Inc. Print:|SBN07381-33930SH95031 SBN0-7381-3394-9ss95031 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Standards documents are developed within the ieee societies and the standards coordinating committees of the IEEE Standards Association (IEEE-SA) Standards Board. The ieee develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied view points and interests to achieve the final product. Volunteers are not necessarily members of the Institute and serve without compensation. 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Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center Introduction [This introduction is not part of IEEE Std C62. 41.2-2002, IEEE Recommended Practice on Characterization of Surges in Low-Voltage(1000 V and less) ac Power circuits. This recomnended practice is the result of 20 years of evolution from the initial 1980 docunent, IEEE Std 587, IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits, which promptly became IEEE Std C62.41 with the same title. The guide was updated in 1991 as IEEE Std C62. 41-1991, IEEE Recommended Practice on Surge Voltages in Low-Voltage AC Power Circuits, reflecting new data on the surge environment and experience in the use (and misuse) of the original guide. The purpose of the document was and still is to provide information on the surge environment and offer recommendations to interested parties involved in developing test and application standards related to surge protective devices (SPDS)as well as recommendations to equipment designers and users The 1980 version, based on data available up to 1979, proposed two novel concepts 0 The reduction of a complex database to two representative surges: a new"Ring Wave"featuring a decaying 100 kHz oscillation, and the combination of the classical, well-accepted 1.2/50 us voltage waveform and 8/20 us current waveform into a"Combination Wave to be delivered by a surge generator having a well-defined open-circuit voltage and short-circuit current b) The concept that location categories could be defined within an installation where surge voltages impinging upon the service entrance of an installation or generated within an installation would propagate, unabated, in the branch circuits, while the associated currents, impeded by(mostly) the inductance of the conductors would be reduced from the service entrance to the end of long branch The 1991 version, based on additional data as well as experience in the use of the 1980 guide, maintained the concepts of the location categories and the recommendation of representative surge waveforms. The two seminal surges, Ring Wave and Combination Wave, were designated as"standard surge-testing waveforms, and three new "additional surge-testing waveforms" were added to the"menu. Meanwhile, a companion document, IEEE Std C62. 45-1992, IEEE Guide on Surge Testing for Equipment Connected to Low- Voltage AC Power Circuits, was developed, outlining procedures for error-free application of the waveforMs defined by Ieee Std C62.41-1991 while enhancing operator safet The perceived need to justify the expansion of the two-only waveforms to a menu of five led to the growth il he document volume, from the 25-page IEEE Std 587-1980 to the 111-page IEEE Std C62.41-1991 Additional data collected toward an update of the 1991 version(which was reaffirmed in 1996)would have increased further the volume of the document. Instead, a new approach was selected: to create a"Trilogy Dy separating the information into three distinct documents, making their use more reader-friendly while maintaining the credibility of the recommendations a guide on the surge environment in low-voltage ac power circuits, including a broad database (eee StdC62.41.1-2002 A nended practice on characterization of surges in low-voltage ac power circuits( the present document A recommended practice on surge testing for equipment connected to low-voltage ac power circuits (IEEE Std C62.45-2002) In this manner, interested parties will have a faster, simpler access to the recommendations for selecting representative surges relevant to their needs. a comprehensive database will be available for parties desirin to gain a deeper understanding of the surge environment and an up-to-date set of recommendations on surge testing procedures CopyrightC 2003 IEEE. All rights reserved Participants At the time this recommended practice was completed, the Working Group on Surge Characterization on Low-Voltage Circuits had the following membership: Hans steinhoff chair James Funke, Co-Chair Raymond Hill, Secretary Francois D. Martzloff, Technical editor Rie chard Bentingcr Michal Hopkins Richard odcnbers William Bush Deborah Jennings-Conner Alan w. rebeck Ernie gallo Philip j. Jones Michael stringfellow Andrea Turner haa Wilhem H. Kapp S. Frank Waterer Jim harrison Joseph l. Koepfinger Don worden Other individuals who contributed review and comments in developing this recommended practice are PP Barker W. Goldbach D. Messina Birkl P lasse R. W. Northrop B. Connatscr G. Kor K.O. Phipps T.R. Conrad T S J.B. Po C. Dhooge D. Lacey V.A. Rakov D. Dorr Levine A. Rousseau H.E. Foelker A Mansoor S.G. Whisenant G.L. Goedde W.. Zischank The following members of the balloting committee voted on this standard. balloters may have voted for tention Richard bentinger Percy E Pool James Case Philip j. Jones R.V. Rebbapragada Chrys Chrysanthou Wilhelm II. Kapp Alan w. rebeck Bryan R. cole Joseph L. Kocpfingcr Tim E. Royster Bill Curry Benny h Lee Mark s. simon Douglas c. dawson Carl E Lindquist Hans steinhoff E. P Dick William a. maguire AntonⅴJ. Surtees Clifford C. erven Francois D. Martzloff Donald B. turner Ernie gallo Nigel P. McQuin Frank Waterer Gary Goedde L. Michel James w. wilson Jim harrison Richard odenberg Jonathan j. wood worth Steven P. Hensley Joseph c. osterhout Donald m. worden Michael Parente Copyright 2003 IEEE. All rights reserved At the time when this document was sent to ballot, the accredited standards committee on Surge arresters c62. had the following members Joseph l. keplinger, Chair S. Choinski, Secretary Vacant, NEMA Co-Secretary Naeem Ahmad IEEE Co-Secretary Organization Represented Name of representative Electric Light Power(EED . S Case T. Field W.A. Maguire L.F. V Wilson T.A. Wolfe C. G. Crawford IEEE,.,,,, ∴.....M.G. Comber W.H. Kapp J. L. Koepfinger R Odenberg T Rozek K B Stump E. Taylor NEMA L. Block Vacant P. Jeffries ∴.,,...,D.W.Lenk Vacant . Woodworth Association of American Railroads(Aarr).......... W. Etter Bonneville Power Administration(BPA) G.E.L Canadian standards ,,,,,,,,,,....,D.M. Smith International Electrical Testing Association (NETA) A. Peterson ·· M.R. Jordan NIST E.D. Martzloff Rural Electrication Administration REa) E. Cameron Telecommunications information sy ystems(TCIS C. Chrysanthou Underwriters laboratories D. Jennings-Conner Individuals J. Osterhout S.G. whisenant I.J. Steinhoff CopyrightC 2003 IEEE. All rights reserved When the TFFE-SA Standards board approved this recommended practice on I 1 November 2002, it had the following membership James T Carlo, Chair James H. Gurney, Vice chair Judith gorman. Secretary Sid bennett Toshio Fukuda Nader mehravari H. Stephen Berger Arnold m. greenspan Daleep c mohla Clyde R Camp Raymond Hapeman William J Moylan Richard De blasio Donald m. herman Malcolm v, thaden Harold E. epstein Richardh. hulett Geoffrey O. Thompson Julian forsters Lowell g. johnson Howard l. wolfman Howard m. frazier Joseph L. Koepfinger Don wright Peter, li Also included is the following nonvoting ieee-sa standards board liaison Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Don Messina, IEEE Standards Project editor Copyright 2003 IEEE. All rights reserved V1l Contents 1. Overview 1.1 Scope....................., 1. 2 Purpose 1. 3 How to use this document 1. 4 Context and contents 2. References 12335666 2.1 General 2.2 Reference documents………… 3. Definitions 4. Summary of the surge environment 7 4.1 General 7 4.2 Lightning surges 4.3 Switching surges….….….…….……...…...8 4.4 Systems-interaction overvoltages 4.5 Location categories-Scenario I 4.6 Direct flash to the structure-Scenario li 899 4.7 Exposure level.… 5. Development of recommended selection of representative surge 5.1A 5.2 Worst-case design and economic trade-off 12 5.3 Surge effects… 14 6. Definition of standard surge-testing waveforms 6.1 General 15 6.2 Selection of peak values of standard waveforms 6.3 Detailed specifications of waveforms 20 7. Definition of additional surge-testing waveforms 7.1 The eft burst 4,· 7.2 The 10/1000 us Long Wave 7.3 The capacitor-switching ring wave .26 7.4 Scenario II parameters 27 oncluding remarks 27 Annex A (informative) Scenario II parameters ····++:“+++“4·“ 29 Annex B( informative) Bibliography..….… ·自 36 Index 39 V111 CopyrightC 2003 IEEE. All rights reserved iEEE Recommended practice on Characterization of Surges in Low-Voltage(1000V and less) AC Power Circuits Overview This recommended practice is the second document in a Trilogy of three IEEE standards addressing surges in low-voltage ac power circuits; the other two companion documents are described in 1. 4. This recommended practice is divided into eight clauses. Clause l provides the scope of this recommended practice and its context with respect to other Ieee standards directly related to the subject. Clause 2 lists references to other standards that are necessary for full implementation of the recommendations. clause 3 is limited to a statement referring to existing dictionaries since no new definitions have been generated for this document. Clause 4 provides a summary of the surge environment described in detail in the database of the companion guide IEEE Std C62.41. 1-2002. Clause 5 proposes how this complex database can be simplified toward selecting a few representative surge waveforms that will be more specifically defined in this recommended practice. Clause 6 presents the recommendation for two standard waveforms that should cover the majority of cases. Clause 7 presents suggestions for additional test waveforms that might be appropriate for particular cases, including the rare event of a direct lightning flash to the structure of interest Clause 8 offers some concluding remarks. Informative Annex a provides a discussion of the stress parameters associated with a direct flash to the building of interest Many citations appear, in support of a statement or recommendation, or for greater details. These citations refer to Informative Annex B of this recommended practice. Also, a synopsis of these citations is provided in Informative Annex D of the companion guide IEEE Std C62. 41. 1-2002. That guide also contains an Informative Annex b that provides further tutorial information on the background of the surge waveform selection process. Also as further information to the reader of the three docunents of the Trilogy Informative Annex c of ieee std C62..1-2002 contains some relevant definitions and discussions concerning the definitions There are no specific models that are representative of all surge environments; the complexities of the real world need to be simplified to produce a manageable set of standard surge tests. To this end, a surge environ- ment classification scheme is presented. This classification provides a practical basis for the selection of waveforms and amplitudes of surge voltages and surge currents that may be applied to evaluate the surge withstand capability of equipment connected to these power circuits. It is most important to recognize that IInformation on references can be found in Clause 2 and in 2.2 Copyright o 2003 IEEE. All rights reserved

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