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详细说明:CY62157ESL 英文资料 CYPRESS 原厂资料,8-Mbit(512Kx16)CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Pin Configuration
Figure 1. 44-Pin TSOP II (Top View)
A342
AAA
Ao d5
444443
0□BHE
6
9口BLE
10007
8□O
10,8
37Wo14
O2囗9
O3囗10
3333
00
SS
vvVWAAAAA
23456789
32口MO
10
O6囗1
30
/E
17
16
oooAgAAA
15
13
Product Portfolio
Power Dissipation
Vcc Range(V)[1]
Speed
Operating Icc, (mA)
Product
Range
Standby, IsB2
(ns)
f=1 MHz
f=f
(uA)
max
Typ/2 Max Typ (2) Max Typ
[2]Max
CY62157ESL Industrial 2.2 V-3.6V and 4.5 V-55V
45
1.8
3
18
2
Notes
1. Datasheet specifications are not guaranteed for Vcc in the range of 3.6V to 4.5V
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at Vcc =3 V, and Vcc =5V, TA=25C
Document #: 001-43141 ReV.*C
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CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Maximum Ratings
Output Current into Outputs(LOW)
20 mA
Static Discharge Voltage
Exceeding the maximum ratings may impair the useful life of the
device. These user guidelines are not tested
(MIL-STD-883. Method 3015)
>200mA
Storage Temperature
65°to+150°C
atch up Current
Ambient Temperature with
Power Applied
.55°to+125°C
Operating Range
Supply Voltage to Ground Potential
0.5Vto6.0V
Device
Range
Ambient
DC Voltage Applied to Outputs
Temperature
in High-z State[3, 4]
0.5Vto6.0V
cY62157 ESL Industrial-40°ct+85°|2.2V-3.6V,
DC Inout voltage/3,4]
0.5∨to6.0V
and 45V-55V
Electrical characteristics
Over the Operating Range
45 ns
Parameter
Description
Test Conditions
Min Typ
Max
Unit
VOH
Output high voltage 2.2 Vcc-02V
cC=1.5V
LA
N≥Vcc-0.2 V or Vin≤0.2V
CC=2.0 V
CDR
Chip deselect to data
0
ns
retention time
Operation recovery time
ns
Figure 3. Data Retention Waveform
DATA RETENTION MOD
vDR≥1.5V
C(min)
tR
or
BHE. 31
Notes
10. 10Chip enable(CE)needs to be tied to CMoS levels to meet the lsB1lsB2 I ICCDR spec Other inputs can be lelt lnaing'Ond Vcc=5V,TA=25C
9. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at Vcc =3
11. Tested initially and after any design or process changes that may affect these parameters
12. Full device operation requires linear Vcc ramp from VDR to Vcc(min>
100 us or stable at Vcc(min)2 100uIs
13. BHE BLE is the AND of both BHE and BLE Deselect the chip by either disabling chip enable signals or by disabling both BHE and BLE
Document #: 001-43141 ReV.*C
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CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Switching Characteristics
Over the Operating Range
45 ns
Parameter[14]
Description
Unit
Min
Ma
ax
Read cycle
tRC
Read cycle time
45
ns
Address to data valid
45
ns
OHA
Data hold from address change
10
ns
ce LOW to data valid
45
ns
DOE
OE LOW to data valid
ns
OE
OE LOW to LoW-7[151
5
HZOE
OE HIGH to High-Zl15, 16
CE
cE loW to Low -zl151
10
ns
LHZCE
HIGH to High-z115, 16
18
ns
CE LOW to power up
0
ns
D
CE HIGH to power down
45
ns
DBE
BLE/BHE LOW to data valid
45
ns
LZBE
BLE/BHE LOW to Low - 15, 17]
HZBE
BLE/BHE HIGH to HiGH-Z[15, 16]
18
ns
Write Cycle[18
Write cycle time
45
ns
sce
CE LOW to write end
35
ns
Address setup to write end
35
ns
Address hold from write end
0
ns
Address setup to write start
0
ns
E
WE pulse width
35
ns
中ts中
BLE/BHE LOW to write end
35
ns
Data setup to write end
25
ns
Data hold from write end
0
tHZWE
WE LOW to High-z[15, 16
18
ns
LLZE
WE HIGH to Low-Z115
10
Notes
14. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0
to 3 V, and output loading of the specified IoL/OH as shown in the AC Test Loads and Waveforms on page 5
15. At any temperature and voltage condition, tHZcE is less than tLZCe, tHzbE is less than tLzbe, tHZOe is less than tLzoE, and tHzwe is less than tLzwe for any device
16. tHZoE, tHzcE, tHzBE, and tHzwe transitions are measured when the outputs enter a high-impedance state
17. If both byte enables are toggled together, this value is 10 ns
18. The internal write time of the memory is defined by the overlap of WE, CE= VIl, BHE, ble or both= VL. All signals must be active to initiate a write and any of these
signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write
Document #: 001-43141 ReV.*C
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CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Switching Waveforms
Figure 4. Read Cycle No. 1: Address Transition Controlled. [ 19, 201
RC
ADDRESS
tAA
tOHA
DATA OUT
PREVIOUS DATA VALID
米Ⅹ×
DATA VALID
Figure 5. Read Cycle No. 2: OE Controlled [20,21]
ADDRESS
tRC
ace
HZCE
OE
中HzoE
DOE
BHE/BLE
LOE
HZBE
DBE
HIGH
HIGHMPEDANCE
IMPEDANCE
DATA OUT
DATA VALID
U
50%
50%
SUPPLY
CURRENT
Notes
19. The device is continuously selected OE, CE= VIL, BHE, BLE, or both=VIL
20. WE is HIGH fo
d cycle
21. Address valid before or similar to ce. bhe ble transition low
Document #: 001-43141 ReV.*C
Page 8 of 16
CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Switching Waveforms(continued)
Figure 6. Write Cycle No 1: WE Controlled [22, 23, 24
ADDRESS
CE
WE
BHE/BLE
DATA IO
E心×
DATAU
HZOE
Figure 7. Write Cycle 2: CE Controlled (22, 23, 24
ADDRESS
CE
S
SA
HA
tpWE
BHE/BLE
tBW
OE
lsi
DATA DO
NOTE 25
DATA
N
tHZE≯
Notes
22. The internal write time of the memory is defined by the overlap of WE, CE=VIL, BHE, Ble or both=VIL. All signals must be active to initiate a write and any of these
signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write
24. If ce goes HIGH simultaneously with WE=VI, the output remains in a high impedance state
25. During this period, the lOs are in output state. Do not apply input signals
Document #: 001-43141 ReV.*C
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CYPRESS
cY62157 ESL MOBL⑧
PERF。RM
Switching Waveforms(continued)
Figure 8. Write Cycle 3 WE controlled, OE LOW(26, 27, 28
twc
ADDRESS
BHE/BLE
W
WE
tHD
tsp
DATA O
交M、××人
DATAL
Figure 9. Write Cycle 4: BHE/BLE Controlled, OE LOW[26,27, 281
ADDRESS
CE S
tscE
A
BHE/BLE
tBW
WE
HZWE
DATA DO
NOTE 29
DATA
Notes
26. The internal write time of the memory is defined by the overlap of We, ce=Vil, Bhe, ble or both VI. All signals must be active to initiate a write and any of
2> SIgnals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write. se
28. If CE goes HIGH simultaneously with WE=VH, the output remains in a high impedance state.
29. During this period, the lOs are in output state. Do not apply input signals
Document #: 001-43141 ReV.*C
Page 10 of 16
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