This standard defines a test access port and boundary-scan architecture for digital integrated circuits and forthe digital portions of mixed analog/digital integrated circuits. The facilities defined by the standard seek toprovide a solution to the
The STM3210B-EVAL is an evaluation board for STMicroelectronic’s ARMTM Cortex-M3 core-based STM32F10x 128K microcontrollers. It is designed as a complete development environment for the STM32F10x microcontrollers with full speed USB2.0, CAN2.0A/B co
The IEEE 1149.1 Test Access Port (TAP) and Boundary-Scan architecture, commonly referred to as JTAG, is a popular testing method. JTAG is an acronym for the Joint Test Action Group, the technical subcommittee initially responsible for developing the
jtag tap控制器。非状态机实现。 The JTAG TAP controller used for development purposes (Boundary Scan testing, Memory BIST and debugging) and is as such an interface between the processor(s), peripheral cores, and any commercial debugger/emulator or BS testing d
