This standard defines a test access port and boundary-scan architecture for digital integrated circuits and forthe digital portions of mixed analog/digital integrated circuits. The facilities defined by the standard seek toprovide a solution to the
This new book will act an introduction to as well as a practical guide to Boundary-Scan testing. The ever increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of
The IEEE 1149.1 Test Access Port (TAP) and Boundary-Scan architecture, commonly referred to as JTAG, is a popular testing method. JTAG is an acronym for the Joint Test Action Group, the technical subcommittee initially responsible for developing the
可测性设计中的边界扫描 In this tutorial, you will learn the basic elements of boundary-scan architecture — where it came from, what problem it solves, and the implications on the design of an integrated-circuit device. This tutorial also provides an overview o
In this tutorial, you will learn the basic elements of boundary-scan architecture — where it came from, whatproblems it solves, and its implications on the design of an integrated-circuit device. This tutorial also provides anoverview of the data st
